• DocumentCode
    2362919
  • Title

    A small span theorem for P/Poly-Turing reductions

  • Author

    Lutz, Jack H.

  • fYear
    1995
  • fDate
    19-22 Jun 1995
  • Firstpage
    324
  • Lastpage
    330
  • Abstract
    This paper investigates the structure of ESPACE under nonuniform Turing reductions that are computed by polynomial-size circuits (P/Poly-Turing reductions). A small span theorem is proven for such reductions. This result says that every language A in ESPACE satisfies at least one of the following two conditions. (i) The lower P/Poly-Turing span of A (consisting of all languages that are P/Poly-Turing reducible to A) has measure 0 in PSPACE. (ii) The upper P/Poly-Turing span of A (consisting of all languages to which A is P/Poly-Turing reducible) has pspace-measure 0, hence measure 0 in ESPACE. The small span theorem implies that every P/Poly-Turing degree has measure 0 in ESPACE, and that there exist languages that are weakly P-many-one complete, but not P/Poly-Turing complete for ESPACE. The method of proof is a significant departure from earlier proofs of small span theorems for weaker types of reductions. P/Poly-Turing span of A (consisting of all languages to which A is P/Poly-Turing reducible) has pspace-measure 0, hence measure 0 in ESPACE. The small span theorem implies that every P/Poly-Turing degree has measure 0 in ESPACE, and that there exist languages that are weakly P-many-one complete, but not P/Poly-Turing complete for ESPACE. The method of proof is a significant departure from earlier proofs of small span theorems for weaker types of reductions
  • Keywords
    Turing machines; computational complexity; ESPACE; P/Poly-Turing reductions; nonuniform Turing reductions; polynomial-size circuits; small span theorem; weakly P-many-one complete; Circuits; Complexity theory; Computer science; Lifting equipment; Polynomials; Security; Time measurement; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Structure in Complexity Theory Conference, 1995., Proceedings of Tenth Annual IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1063-6870
  • Print_ISBN
    0-8186-7052-5
  • Type

    conf

  • DOI
    10.1109/SCT.1995.514870
  • Filename
    514870