Title :
A novel approach to pattern recognition based on discriminative metric design
Author :
Watanabe, Hideyuki ; Yamaguchi, Tsuyoshi ; Katagiri, Shigeru
Author_Institution :
ATR Interpreting Telephony Res. Labs., Kyoto, Japan
fDate :
31 Aug-2 Sep 1995
Abstract :
This paper proposes a novel approach, named discriminative metric design (DMD), to pattern recognition. DMD optimizes the whole metrics of discriminant functions with the minimum classification error/generalized probabilistic descent method (MCE/GPD) such that the intrinsic features of each pattern class can be represented efficiently. The resulting metrics lead accordingly to robust recognizers. DMD is quite general. Several existing methods, such as learning vector quantization, subspace method, discriminative feature extraction, radial-basis function network, and the continuous hidden Markov model, are defined as its special cases. Among the many possibilities, this paper specifically elaborates the DMD formulation for recognizing fixed dimensional patterns using quadratic discriminant functions, and clearly demonstrates its utility in a speaker-independent Japanese vowel recognition task
Keywords :
minimisation; pattern recognition; probability; continuous hidden Markov model; discriminative feature extraction; discriminative metric design; fixed dimensional pattern recognition; generalized probabilistic descent method; learning vector quantization; minimum classification error; pattern recognition; quadratic discriminant functions; radial-basis function network; speaker-independent Japanese vowel recognition task; subspace method; Degradation; Design methodology; Feature extraction; Hidden Markov models; Optimization methods; Pattern recognition; Prototypes; Robustness; Speech recognition; Vector quantization;
Conference_Titel :
Neural Networks for Signal Processing [1995] V. Proceedings of the 1995 IEEE Workshop
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-2739-X
DOI :
10.1109/NNSP.1995.514878