Title :
Assessment of the accuracy of the 28Si (220) plane spacing
Author :
Mana, G. ; Massa, Ernesto ; Sasso, C.
Author_Institution :
INRIM - Ist. Naz. di Ricerca Metrol., Turin, Italy
Abstract :
The unexplained inconsistency of the measured values of the Planck constant indicates that an error was made in at least one measurement. Therefore, all the experimental apparatuses are under careful scrutiny. This paper relates about the re-examination of the lattice-parameter measurement of silicon crystals. Measurement repetitions with an entirely new laser interferometer are under way.
Keywords :
elemental semiconductors; light interferometers; measurement by laser beam; silicon; spatial variables measurement; Planck constant measurement; Si; experimental apparatus; laser interferometer; lattice-parameter measurement; measurement error; plane spacing accuracy assessment; silicon crystal; Crystals; Optical diffraction; Optical interferometry; Optical variables measurement; Silicon; Temperature measurement; Uncertainty; Avogadro constant; Si lattice parameter; optical interferometry; precision measurements; x-ray interferometry;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898426
