• DocumentCode
    236324
  • Title

    Assessment of the accuracy of the 28Si (220) plane spacing

  • Author

    Mana, G. ; Massa, Ernesto ; Sasso, C.

  • Author_Institution
    INRIM - Ist. Naz. di Ricerca Metrol., Turin, Italy
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    396
  • Lastpage
    397
  • Abstract
    The unexplained inconsistency of the measured values of the Planck constant indicates that an error was made in at least one measurement. Therefore, all the experimental apparatuses are under careful scrutiny. This paper relates about the re-examination of the lattice-parameter measurement of silicon crystals. Measurement repetitions with an entirely new laser interferometer are under way.
  • Keywords
    elemental semiconductors; light interferometers; measurement by laser beam; silicon; spatial variables measurement; Planck constant measurement; Si; experimental apparatus; laser interferometer; lattice-parameter measurement; measurement error; plane spacing accuracy assessment; silicon crystal; Crystals; Optical diffraction; Optical interferometry; Optical variables measurement; Silicon; Temperature measurement; Uncertainty; Avogadro constant; Si lattice parameter; optical interferometry; precision measurements; x-ray interferometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898426
  • Filename
    6898426
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=236324