Title :
Influence of inductance on the arc evolution in AgMeO electrical contacts
Author :
Kharin, S.N. ; Nouri, H. ; Davies, T.
Author_Institution :
West of England Univ., Bristol, UK
Abstract :
Three consecutive stages of arc evolution (anodic loss stage, compensation stage and cathodic loss stage) with influence of inductance on the phenomena in opening AgCdO contacts are considered. The mathematical model is based on the measured arc and voltage dynamics and differential equations for electrical circuit, heat equations for electrodes and arc, power balance on anode and cathode surfaces and equations for near-electrode zones. It describes non-stationary temperature fields in anode, cathode and arc column with transition from the metallic arc phase to the gaseous one. The dependence of bridge and arc duration on inductance is discussed theoretically and verified by experimental data. The duration of gaseous arc phase is found dependently on the value of the inductive time constant, while duration of metallic phase depends on inductance weakly. It is shown that dynamics and direction of material transfer during arcing are conditioned by redistribution of cathode and anode temperature and evaporation losses in the course of arc evolution. They depend also on the value of opening velocity.
Keywords :
cadmium compounds; circuit-breaking arcs; compensation; electrical contacts; inductance; particle reinforced composites; silver; AgCdO; anode temperature; anodic loss stage; arc evolution; bridge duration; cathode temperature; cathodic loss stage; compensation stage; electrical contacts; evaporation losses; heat equations; inductance; inductive time constant; material transfer; near-electrode zones; nonstationary temperature fields; opening velocity; power balance; voltage dynamics; Anodes; Cathodes; Contacts; Differential equations; Electric variables measurement; Inductance; Mathematical model; Power measurement; Temperature; Voltage measurement;
Conference_Titel :
Electrical Contacts, 2002. Proceedings of the Forty-Eighth IEEE Holm Conference on
Print_ISBN :
0-7803-7433-9
DOI :
10.1109/HOLM.2002.1040830