Title :
Electronic THz reflection spectroscopy for detecting energetic materials
Author :
Agrawal, V. ; Bork, T. ; Kee, S. ; van der Weide, D.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Delaware Univ., Newark, DE, USA
Abstract :
We report the first 10-450 GHz single pixel reflection spectra of several energetic materials (explosives). These are measured with an all-electronic reflection spectrometer, and we compare them to those of common objects and human skin to show differences in dielectric contrast. This instrument uses microwave sources to drive picosecond GaAs nonlinear transmission lines and sampling detectors, so it can form the basis of a fully integrated circuit spectroscopic imaging system for screening in security applications
Keywords :
electromagnetic wave reflection; explosions; gallium arsenide; security; submillimetre wave imaging; submillimetre wave spectroscopy; transmission lines; 10 to 450 GHz; GaAs; THF; dielectric contrast; electronic THz reflection spectroscopy; energetic materials detection; explosives; microwave sources; picosecond GaAs nonlinear transmission lines; picosecond sampling detectors; screening; security applications; single pixel reflection spectra; spectroscopic imaging system; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Explosives; Humans; Instruments; Integrated circuit measurements; Reflection; Skin; Transmission line measurements;
Conference_Titel :
Terahertz Electronics Proceedings, 1998. THz Ninety Eight. 1998 IEEE Sixth International Conference on
Conference_Location :
Leeds
Print_ISBN :
0-7803-4903-2
DOI :
10.1109/THZ.1998.731657
