Electronic THz reflection spectroscopy for detecting energetic materials

Author

Agrawal, V. ; Bork, T. ; Kee, S. ; van der Weide, D.W.

Author_Institution

Dept. of Electr. & Comput. Eng., Delaware Univ., Newark, DE, USA

fYear

1998

fDate

3-4 Sep 1998

Firstpage

34

Lastpage

37

Abstract

We report the first 10-450 GHz single pixel reflection spectra of several energetic materials (explosives). These are measured with an all-electronic reflection spectrometer, and we compare them to those of common objects and human skin to show differences in dielectric contrast. This instrument uses microwave sources to drive picosecond GaAs nonlinear transmission lines and sampling detectors, so it can form the basis of a fully integrated circuit spectroscopic imaging system for screening in security applications

Keywords

electromagnetic wave reflection; explosions; gallium arsenide; security; submillimetre wave imaging; submillimetre wave spectroscopy; transmission lines; 10 to 450 GHz; GaAs; THF; dielectric contrast; electronic THz reflection spectroscopy; energetic materials detection; explosives; microwave sources; picosecond GaAs nonlinear transmission lines; picosecond sampling detectors; screening; security applications; single pixel reflection spectra; spectroscopic imaging system; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Explosives; Humans; Instruments; Integrated circuit measurements; Reflection; Skin; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Terahertz Electronics Proceedings, 1998. THz Ninety Eight. 1998 IEEE Sixth International Conference on

Conference_Location

Leeds

Print_ISBN

0-7803-4903-2

Type

conf

DOI

10.1109/THZ.1998.731657

Filename

731657