DocumentCode :
2363666
Title :
A new method to investigate electrical conduction in crimp joints. Influence of the compaction ratio and electrical model
Author :
Prin, G. Rosazza ; Courtin, T. ; Boyer, L.
Author_Institution :
Corporate Res. Center, FCI France, La Ferte Bernard, France
fYear :
2002
fDate :
2002
Firstpage :
246
Lastpage :
251
Abstract :
The principle of electrical contact by open barrel crimp has been known and applied for a long time, above all in its "B" style shape. To realise this kind of electrical connection, a conductive wire is stripped and put into a contact element with open wings, then the wings are closed on the conductive strands by a "punch/anvil" system. According to the depth to which the punch falls, strands are more or less squeezed, and this is evaluated by the "section reduction ratio" parameter. The object of this work is first of all to describe an original experimental method to characterise the electrical behaviour of the crimp. This approach allows one to measure apparent inter strand and strand/barrel contact resistance values. Next, the influence of compaction ratio on the resistance distribution is investigated. Finally, a crimp model and an inverse method allowing one to determine the real contact resistance values from the apparent ones are proposed.
Keywords :
contact resistance; electric connectors; electrical conductivity; electrical contacts; modelling; wires (electric); B-style shape; compaction ratio; conductive wire; crimp electrical behaviour characterisation; crimp joints; crimp model; electrical conduction; electrical connection; electrical contact; electrical model; inverse method; open barrel crimp; punch/anvil system; resistance distribution; section reduction ratio parameter; strand/barrel contact resistance values; Compaction; Contact resistance; Crimping; Force measurement; Inverse problems; Postal services; Shape; Surface finishing; Vehicles; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2002. Proceedings of the Forty-Eighth IEEE Holm Conference on
Print_ISBN :
0-7803-7433-9
Type :
conf
DOI :
10.1109/HOLM.2002.1040848
Filename :
1040848
Link To Document :
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