• DocumentCode
    2363670
  • Title

    Development of a Yarn Evenness Measurement and Hairiness Analysis System

  • Author

    Carvalho, V. ; Cardoso, P. ; Belsley, M. ; Vasconcelos, R.M. ; Soares, F.O.

  • Author_Institution
    Dept. de Electron. Ind., Minho Univ.
  • fYear
    2006
  • fDate
    6-10 Nov. 2006
  • Firstpage
    3621
  • Lastpage
    3626
  • Abstract
    This paper presents an automatic yarn characterization system, based on capacitive sensors for evenness measurement and on optical sensors for hairiness analysis. This approach enables direct yarn mass determination in 1 mm range for evenness, an increase by a factor of eight over the most common commercial solutions (8 mm), and will also enable hairiness measurement up to 1 mm with high accuracy. This system determines all parameters commonly used in textile industry, for different sensitivity values defined by the operator. It also presents new parameters, not measured by commercial equipments (integral deviation rate-IDR, different signal processing techniques to detect error patterns (fast Walsh-Hadamard transform-FWHT) and other adapted parameters (deviation rate-DR, spectrograms (fast Fourier transform-FFT), coefficient of variation-CV, mean deviation-U, number and length of faults)
  • Keywords
    Hadamard transforms; capacitive sensors; fast Fourier transforms; optical sensors; sensitivity analysis; signal processing; textile industry; yarn; FFT; automatic yarn characterization system; capacitive sensors; coefficient of variation; direct yarn mass determination; fast Fourier transform; fast Walsh-Hadamard transform; hairiness analysis system; mean deviation; optical sensors; textile industry; yarn evenness measurement; Adaptive signal detection; Capacitive sensors; Density measurement; Fabrics; Length measurement; Optical sensors; Optical signal processing; Signal processing; Textile industry; Yarn;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
  • Conference_Location
    Paris
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0390-1
  • Type

    conf

  • DOI
    10.1109/IECON.2006.347502
  • Filename
    4152992