Title :
Characterization of hybrid metal/semiconductor electron pumps for quantum metrology
Author :
Charron, T. ; Devoille, L. ; Djordjevic, S. ; Seron, O. ; Piquemal, F. ; Clapera, P. ; Ray, S.J. ; Jehl, Xavier ; Wacquez, R. ; Vinet, M.
Author_Institution :
LNE, Trappes, France
Abstract :
We present measurements of the quantized current delivered by a hybrid metal/semiconductor electron pump. Here we report on the dependence of the quantized current as a function of various control parameters at temperatures below 1 K. This characterization was done with a 20000 turns cryogenic current comparator (CCC) in internal feedback mode. Stability measurements over more than 10 hours have demonstrated a relative type A standard uncertainty of 4 parts in 106. To benefit from the high accuracy of the CCC, we are currently improving the traceability of the current measurement.
Keywords :
circuit feedback; cryogenic electronics; current comparators; electric current measurement; measurement standards; measurement uncertainty; semiconductor devices; CCC; cryogenic current comparator; hybrid metal-semiconductor electron pump; internal feedback mode; quantum current measurement; quantum current metrology; stability measurement; standard uncertainty; Cryogenics; Current measurement; Logic gates; Metals; Metrology; Semiconductor device measurement; Silicon; Cryogenic current comparator; Electron pumps; Quantum metrology;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898449