Title :
High-temperature integration of silicon carbide (SiC) and silicon-on-insulator (SOI) electronics in multichip power modules (MCPMs)
Author :
Hornberger, J. ; Mounce, S. ; Schupbach, R. ; McPherson, B. ; Mustain, H. ; Mantooth, A. ; Brown, W. ; Lostetter, A.B.
Author_Institution :
Arkansas Power Electron. Int. Inc., Fayetteville, AR
Abstract :
Arkansas Power Electronics International, Inc, (APEI, Inc.) and University of Arkansas researchers have developed a novel, highly miniaturized motor drive capable of operation in excess of 250 degC. The high-temperature multichip power module (MCPM) integrates silicon carbide (SiC) JFET power transistors with high-temperature MOS silicon-on-insulator (SOI) control electronics into a single, highly miniaturized and compact power package. This paper outlines the design philosophy behind the high-temperature MCPM, discuss the high-temperature packaging technologies (including substrate selection, wirebonding, and die attach) developed and employed for module fabrication, illustrate thermal modeling results of the package, and present the results of prototype testing (demonstrating functionality)
Keywords :
MOSFET; high-temperature electronics; junction gate field effect transistors; motor drives; multichip modules; silicon compounds; silicon-on-insulator; wide band gap semiconductors; JFET power transistors; MCPM; SOI; die attach; high-temperature MOS silicon-on-insulator; high-temperature packaging technologies; miniaturized motor drive; module fabrication; multichip power modules; prototype testing; silicon carbide; substrate selection; Electronic packaging thermal management; Fabrication; Microassembly; Motor drives; Multichip modules; Power electronics; Power transistors; Prototypes; Silicon carbide; Silicon on insulator technology; High-temperature electronics; High-temperature packaging; Silicon carbide (SiC); Silicon on Insulator (SOI);
Conference_Titel :
Power Electronics and Applications, 2005 European Conference on
Conference_Location :
Dresden
Print_ISBN :
90-75815-09-3
DOI :
10.1109/EPE.2005.219683