DocumentCode :
2363873
Title :
Effect of micro/nano-scale rough surface on the Quality Factor of the filter: Model and simulation
Author :
Li, Na ; Zheng, Fei
Author_Institution :
Minist. Key Lab..of Electron. Equip. Mechanism Design, Xidian Univ., Xi´´an, China
fYear :
2010
fDate :
4-7 Aug. 2010
Firstpage :
1744
Lastpage :
1748
Abstract :
A model and simulation research about the effect of roughness in micro/nano-scale on filter inner surface was presented in this paper. The concept and the technical index and measurement method of the effective surface profile has been put forward. This roughness was simulated by an improved two-dimensional (2-D) fractal function to investigate its effect on the power dissipation of the seven-stage filter. After that, a formulation of the power dissipation based on this 2-D roughness model is built. The Quality Factor (QF), an important parameter to value the level of the power dissipation for the filter, was introduced in this system, and the formulation of the QF was deduced according to the influence of the roughness. As a check, a structure model of a seven-stage filter is built for simulation experience, and the values of the QF deduced by formulation and simulation were compared, and the results showed that the changing trend of these was accordant and following the increase of surface roughness, the value of QF would be decreased and the maximum of the decrease was 0.2 times than that of smooth inner surface.
Keywords :
finite element analysis; quality control; surface roughness; surface topography measurement; 2-D roughness model; 2D fractal function; effective surface profile; filter quality factor; measurement method; micro scale rough surface; nano scale rough surface; power dissipation; seven stage filter; surface roughness; Fractals; Power dissipation; Q factor; Rough surfaces; Surface impedance; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mechatronics and Automation (ICMA), 2010 International Conference on
Conference_Location :
Xi´an
ISSN :
2152-7431
Print_ISBN :
978-1-4244-5140-1
Electronic_ISBN :
2152-7431
Type :
conf
DOI :
10.1109/ICMA.2010.5588739
Filename :
5588739
Link To Document :
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