• DocumentCode
    236406
  • Title

    Programmable capacitors developed at NIST

  • Author

    Koffman, A.D. ; Lee, R.D. ; Lee, Lun-Hui ; Shields, S.H. ; Liu, Zhe ; Wang, Yannan

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    478
  • Lastpage
    479
  • Abstract
    NIST has produced several digitally programmable capacitance standards based on a modification of a fixed commercial fused-silica capacitance standard. The commercial device consists of 23 capacitors of roughly binary values that have been configured to combine via computer control to produce any capacitance value in the range from about 0.1 fF to 110 pF, with sub-femtofarad resolution. Upon placing the device in a custom enclosure inside an air bath, the shortterm capacitance stability achieved using a commercial capacitance bridge is approximately 5.0×108 pF over the full capacitance range.
  • Keywords
    bridge circuits; capacitance measurement; capacitors; measurement standards; NIST; air bath; capacitance 0.1 pF to 110 pF; capacitance bridge; commercial fused-silica capacitance standard; computer control; digitally programmable capacitance standard; programmable capacitor; short-term capacitance stability; subfemtofarad resolution; Capacitance; Capacitors; Circuit stability; NIST; Stability criteria; Thermal stability; Air bath; calculable capacitor; programmable capacitor; standard capacitor; temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898467
  • Filename
    6898467