• DocumentCode
    2364601
  • Title

    DFX and Productivity

  • Author

    Aitken, Robert C.

  • fYear
    2009
  • fDate
    5-9 Jan. 2009
  • Firstpage
    8
  • Lastpage
    8
  • Keywords
    Design for manufacture; Design for testability; Design methodology; Educational institutions; Libraries; Manufacturing; Productivity; Research and development; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2009 22nd International Conference on
  • Conference_Location
    New Delhi, India
  • ISSN
    1063-9667
  • Print_ISBN
    978-0-7695-3506-7
  • Type

    conf

  • DOI
    10.1109/VLSI.Design.2009.105
  • Filename
    4749635
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2364601