Title : 
Evaluating environmental performance: a case study in the flat-panel display industry
         
        
            Author : 
Koch, Jonathan ; Keoleian, Gregory
         
        
            Author_Institution : 
Sch. of Natural Resources & Environ., Michigan Univ., Ann Arbor, MI, USA
         
        
        
        
        
        
            Abstract : 
Researchers at the University of Michigan applied their life cycle design framework in a research project with Optical Imaging Systems (OIS). OIS is a US manufacturer of high-performance, active-matrix liquid crystal displays, one of the leading flat panel display technologies. The study evaluated OIS´s environmental management system and how environmental performance may impact competition in the flat panel display industry. Metrics were developed to measure environmental performance in a factory simulation model. Strategies for improvement are recommended according to incremental, reengineering, and future approaches
         
        
            Keywords : 
electronic equipment manufacture; electronics industry; environmental factors; flat panel displays; liquid crystal displays; management; Optical Imaging Systems; US manufacturer; active-matrix LCDs; environmental management system; environmental performance evaluation; factory simulation model; flat-panel display industry; high-performance AMLCD; life cycle design framework; liquid crystal displays; research project; Active matrix liquid crystal displays; Active matrix technology; Computer aided software engineering; Computer industry; Environmental management; Flat panel displays; Manufacturing industries; Manufacturing processes; Optical imaging; Production facilities;
         
        
        
        
            Conference_Titel : 
Electronics and the Environment, 1995. ISEE., Proceedings of the 1995 IEEE International Symposium on
         
        
            Conference_Location : 
Orlando, FL
         
        
            Print_ISBN : 
0-7803-2137-5
         
        
        
            DOI : 
10.1109/ISEE.1995.514968