• DocumentCode
    2364955
  • Title

    A10-bit, 20-MS/s, fully differential single transfer phase CBSC pipelined ADC in 0.18µm CMOS

  • Author

    Zamani, Majid ; Dousti, Massoud ; Nohoji, Amir Hossein Abdollahi

  • Author_Institution
    Dept. of Electr. Eng., Islamic Azad Univ., Tehran, Iran
  • fYear
    2011
  • fDate
    25-27 April 2011
  • Firstpage
    77
  • Lastpage
    82
  • Abstract
    In this paper a fully differential single transfer phase comparator-based switched-capacitor (CBSC) pipelined ADC is presented. The given circuit is a combination of differential and pseudo-differential techniques, so we could benefit from properties of both. Thus, two comparators have been used in the given gain stage, while the output part is fully differential. The obtained combination aims at removal of primary overshoot, omitting two fine current sources, simpler state logic units along with the properties of a fully differential circuit. In terms of power, this architecture consumes much less power than conventional CBSC technique. In order to obtain an appropriate accuracy, a circuit has been introduced to adjust the comparison levels. Finally we designed a 10-bit, 20MS/s fully differential single transfer phase CBSC pipelined ADC in a 0.18-μm 1P6M standard CMOS process. It achieves 79.2-dB spurious-free-dynamic range (SFDR) and 59.74-dB signal-to-noise-and-distortion (SNDR). In addition it consumes 2.25 mW from a 1.8-V power supply at 20MS/s, which obtains a figure of merit of 152 fJ/step.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); switched capacitor networks; CMOS process; analog-digital convertors; comparator-based switched-capacitor; comparators; figure of merit; fully differential circuit; fully differential single transfer phase CBSC pipelined ADC; power 2.25 mW; primary overshoot removal; pseudo-differential technique; signal-to-noise-and-distortion; size 0.18 mum; spurious-free-dynamic range; voltage 1.8 V; word length 10 bit; Accuracy; Charge transfer; Delay; Switches; Transfer functions; Transistors; CBSC; Gain stage; Pipelined ADC; Process variation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Devices, Systems and Applications (ICEDSA), 2011 International Conference on
  • Conference_Location
    Kuala Lumpur
  • ISSN
    2159-2047
  • Print_ISBN
    978-1-61284-388-9
  • Type

    conf

  • DOI
    10.1109/ICEDSA.2011.5959049
  • Filename
    5959049