DocumentCode
2364955
Title
A10-bit, 20-MS/s, fully differential single transfer phase CBSC pipelined ADC in 0.18µm CMOS
Author
Zamani, Majid ; Dousti, Massoud ; Nohoji, Amir Hossein Abdollahi
Author_Institution
Dept. of Electr. Eng., Islamic Azad Univ., Tehran, Iran
fYear
2011
fDate
25-27 April 2011
Firstpage
77
Lastpage
82
Abstract
In this paper a fully differential single transfer phase comparator-based switched-capacitor (CBSC) pipelined ADC is presented. The given circuit is a combination of differential and pseudo-differential techniques, so we could benefit from properties of both. Thus, two comparators have been used in the given gain stage, while the output part is fully differential. The obtained combination aims at removal of primary overshoot, omitting two fine current sources, simpler state logic units along with the properties of a fully differential circuit. In terms of power, this architecture consumes much less power than conventional CBSC technique. In order to obtain an appropriate accuracy, a circuit has been introduced to adjust the comparison levels. Finally we designed a 10-bit, 20MS/s fully differential single transfer phase CBSC pipelined ADC in a 0.18-μm 1P6M standard CMOS process. It achieves 79.2-dB spurious-free-dynamic range (SFDR) and 59.74-dB signal-to-noise-and-distortion (SNDR). In addition it consumes 2.25 mW from a 1.8-V power supply at 20MS/s, which obtains a figure of merit of 152 fJ/step.
Keywords
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); switched capacitor networks; CMOS process; analog-digital convertors; comparator-based switched-capacitor; comparators; figure of merit; fully differential circuit; fully differential single transfer phase CBSC pipelined ADC; power 2.25 mW; primary overshoot removal; pseudo-differential technique; signal-to-noise-and-distortion; size 0.18 mum; spurious-free-dynamic range; voltage 1.8 V; word length 10 bit; Accuracy; Charge transfer; Delay; Switches; Transfer functions; Transistors; CBSC; Gain stage; Pipelined ADC; Process variation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Devices, Systems and Applications (ICEDSA), 2011 International Conference on
Conference_Location
Kuala Lumpur
ISSN
2159-2047
Print_ISBN
978-1-61284-388-9
Type
conf
DOI
10.1109/ICEDSA.2011.5959049
Filename
5959049
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