Title :
Effect of protection diodes on the behavior of CMOS gates in the presence of supply dips
Author :
Amer, Hassanein H.
Author_Institution :
Sci. Dept., American Univ., Cairo, Egypt
Abstract :
This paper shows that, in some CMOS logic gates, the protection diodes may decrease the probability of occurrence of transient failures due to power supply dips. Furthermore, it is observed that protection diodes make output voltage sensitive to some input vectors more than others
Keywords :
CMOS logic circuits; failure analysis; logic gates; power semiconductor diodes; power supply quality; protection; transient analysis; CMOS logic gate; power supply dip; protection diode; transient failure; CMOS logic circuits; Circuit simulation; Diodes; Electronics packaging; Electrostatic discharge; Power supplies; Protection; SPICE; Transmitters; Voltage;
Conference_Titel :
Electrical and Computer Engineering, 1997. Engineering Innovation: Voyage of Discovery. IEEE 1997 Canadian Conference on
Conference_Location :
St. Johns, Nfld.
Print_ISBN :
0-7803-3716-6
DOI :
10.1109/CCECE.1997.608278
