Title :
A Model and Verification for Temperature Dependency of the Noise in Large Size CCD Image Sensor
Author :
Hoshino, Kazuhiro ; Nishimura, Toshihiro
Author_Institution :
Imaging Syst. Dev. Sect., Sony Corp., Tokyo
Abstract :
This paper describes the temperature dependence of the noise of a large size CCD image sensor used in a digital single-lens reflex camera. To clarify the temperature dependence of the noise, the CCD was cooled directly with a Peltier device. The change in noise after black correction of the actual experiment result was consistent with the Shockley-Read-Hall (SRH) model, confirming the validity of this model. Moreover, because the residual noise after black correction increased with temperature, the main factor is considered to be random noise. A comparison result of the two dimensional noise simulations as imaging picture and the actual image in the noise based on the SRH model. 2-D image simulations based on the SRH model agreed well with the experiment data, again confirming the model validity
Keywords :
CCD image sensors; photographic lenses; random noise; 2D image simulations; CCD image sensor; Shockley-Read-Hall model; digital single-lens reflex camera; noise temperature dependency; random noise; Cameras; Charge coupled devices; Charge-coupled image sensors; Heat sinks; Noise cancellation; Noise level; Pixel; Temperature dependence; Temperature sensors; Thermoelectric devices;
Conference_Titel :
IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
Conference_Location :
Paris
Print_ISBN :
1-4244-0390-1
DOI :
10.1109/IECON.2006.347629