Title :
A reliable simple method to extract the intrinsic material properties in millimeter/sub-millimeter wave domain
Author :
Kazemipour, Alireza ; Hudlicka, Martin ; Kleine-Ostmann, Thomas ; Schrader, Thorsten
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
A simple method is presented to extract the material characteristics from the scattering parameters in the frequency domain. The method is based on “transmission” measurement data only and can give the complex permittivity and/or the absorption and refraction index via easy arithmetic operations with closed-form formulas. Therefore, a parametric error analysis will be feasible for metrological aspects to show important uncertainty contributions. The actual measurements have been performed with a compact quasi-optical free-space setup in the frequency band from 50 GHz to 500 GHz and the detailed results are presented to show the performance of the method.
Keywords :
S-parameters; digital arithmetic; electromagnetic wave absorption; frequency-domain analysis; measurement errors; millimetre wave materials; millimetre wave propagation; permittivity measurement; refractive index measurement; submillimetre wave measurement; submillimetre wave propagation; absorption index; arithmetic operations; complex permittivity; frequency 50 GHz to 500 GHz; frequency domain analysis; intrinsic material; measurement uncertainty; parametric error analysis; refraction index; reliable simple method; scattering parameters; submillimeter wave domain; transmission measurement; Antenna measurements; Frequency measurement; Materials; Permittivity; Permittivity measurement; Scattering parameters; Slabs; Extraction methods; Fabry-Perot effects; Material characterization; Measurement uncertainty; Multiple reflection;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898516
