Title :
Two dimensional analytical subthreshold swing model of a double gate MOSFET with Gate-S/D underlap, asymmetric and independent gate features
Author :
Vaddi, Ramesh ; Dasgupta, S. ; Agarwal, R.P.
Author_Institution :
ECE Dept., Indian Inst. of Technol., Roorkee, India
Abstract :
A novel analytical model for subthreshold slope of a generic double-gate MOSFET (DGMOSFET) with gate-to-source/drain underlap is proposed. The accuracy of the new model is verified based on comparisons with previously published models, experimental data and numerical simulation results. With the reduction in body thickness, an improvement in underlap independent gate (4T) DGMOSFET subthreshold slope value is observed, particularly as back gate oxide asymmetry would increase in comparison to that of front gate oxide thickness. Models demonstrate that asymmetric work function underlap 4T DGMOSFETs would have better device subthreshold slope value along with increased back gate oxide asymmetry.
Keywords :
MOSFET; numerical analysis; DGMOSFET subthreshold slope; asymmetric gate features; asymmetric work function underlap 4T; back gate oxide asymmetry; front gate oxide thickness; gate-to-source-drain underlap; generic double-gate MOSFET; independent gate features; numerical simulation; two dimensional analytical subthreshold swing model; Analytical models; Data models; Logic gates; MOSFET circuits; Mathematical model; Numerical models; Silicon; Asymmetric double gate MOSFET; Independent gate (4T) DGMOSFET; Tied gate (3T) DGMOSFET; back gate effects; gate underlap engineering; subthreshold swing model;
Conference_Titel :
Electronic Devices, Systems and Applications (ICEDSA), 2011 International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-61284-388-9
DOI :
10.1109/ICEDSA.2011.5959057