• DocumentCode
    2365333
  • Title

    Analysis and optimization of MIMO capacity by using circuit simulation and embedded element patterns from full-wave simulation

  • Author

    Karlsson, Kristian ; Carlsson, Jan

  • Author_Institution
    SP Tech. Res. Inst. of Sweden, Electron. - EMC, Bors, Sweden
  • fYear
    2010
  • fDate
    1-3 March 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A method for analyzing and optimizing multi-port antennas in MIMO systems is presented and exemplified. The method is based on work presented and uses data from full wave electromagnetic field (EM) solvers in combination with circuit simulations for efficient calculations of radiation properties of multi-port antennas. Here it is shown that the method can also be used for simulations of antennas in a MIMO system. The main advantage of the proposed method is that only a few full-wave simulations, which usually are time consuming, are needed when e.g. optimizing the matching circuits for a multi-port antenna. Since embedded element patterns are used, MIMO capacity (and of course all other relevant antenna parameters) can efficiently be computed for any matching network connected to the antenna ports and for different channel models, both statistical and deterministic.
  • Keywords
    MIMO communication; antenna arrays; antenna radiation patterns; circuit simulation; electromagnetic field theory; optimisation; MIMO capacity; antenna parameters; antenna ports; circuit simulation; electromagnetic field solvers; embedded element patterns; full-wave simulation; matching circuits; matching network; multiport antennas; optimization; radiation properties; Analytical models; Circuit simulation; Computational modeling; Computer networks; Electromagnetic fields; Electromagnetic radiation; Embedded computing; MIMO; Optimization methods; Pattern analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antenna Technology (iWAT), 2010 International Workshop on
  • Conference_Location
    Lisbon
  • Print_ISBN
    978-1-4244-4883-8
  • Electronic_ISBN
    978-1-4244-4885-2
  • Type

    conf

  • DOI
    10.1109/IWAT.2010.5464857
  • Filename
    5464857