• DocumentCode
    2365479
  • Title

    An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays

  • Author

    Ganeshpure, Kunal ; Kundu, Sandip

  • fYear
    2009
  • fDate
    5-9 Jan. 2009
  • Firstpage
    233
  • Lastpage
    238
  • Abstract
    Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.
  • Keywords
    VLSI; crosstalk; fault diagnosis; integer programming; integrated circuit reliability; linear programming; ILP based ATPG technique; ISCAS 85 benchmark circuits; circuit failure; coupling capacitance; gate delays; integer linear programming; multipath fault propagation; multiple aggressor crosstalk faults; pattern generation; signal integrity verification; Automatic test pattern generation; Benchmark testing; Capacitance; Circuit faults; Coupling circuits; Crosstalk; Delay effects; Integer linear programming; Linear programming; Switches; Circuit Transformation; Crosstalk Noise; Delay Fault; Integer Linear Programming; Max-satisfiability; Multiple Aggressors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2009 22nd International Conference on
  • Conference_Location
    New Delhi
  • ISSN
    1063-9667
  • Print_ISBN
    978-0-7695-3506-7
  • Type

    conf

  • DOI
    10.1109/VLSI.Design.2009.10
  • Filename
    4749680