DocumentCode :
2365479
Title :
An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays
Author :
Ganeshpure, Kunal ; Kundu, Sandip
fYear :
2009
fDate :
5-9 Jan. 2009
Firstpage :
233
Lastpage :
238
Abstract :
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.
Keywords :
VLSI; crosstalk; fault diagnosis; integer programming; integrated circuit reliability; linear programming; ILP based ATPG technique; ISCAS 85 benchmark circuits; circuit failure; coupling capacitance; gate delays; integer linear programming; multipath fault propagation; multiple aggressor crosstalk faults; pattern generation; signal integrity verification; Automatic test pattern generation; Benchmark testing; Capacitance; Circuit faults; Coupling circuits; Crosstalk; Delay effects; Integer linear programming; Linear programming; Switches; Circuit Transformation; Crosstalk Noise; Delay Fault; Integer Linear Programming; Max-satisfiability; Multiple Aggressors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2009 22nd International Conference on
Conference_Location :
New Delhi
ISSN :
1063-9667
Print_ISBN :
978-0-7695-3506-7
Type :
conf
DOI :
10.1109/VLSI.Design.2009.10
Filename :
4749680
Link To Document :
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