A Novel Sustained Vector Technique for the Detection of Hardware Trojans

Intentional tampering in the internal circuit structure by implanting Trojans can result in disastrous operational consequences. While a faulty manufacturing leads to a nonfunctional device, effect of an external implant can be far more detrimental. Therefore, effective detection and diagnosis of such maligned ICs in the post silicon testing phase is imperative, if the parts are intended to be used in mission critical applications. We propose a novel sustained vector methodology that proves to be very effective in detecting the presence of a Trojan in an IC. Each vector is repeated multiple times at the input of both the genuine and the Trojan circuits that ensures the reduction of extraneous toggles within the genuine circuit. Regions showing wide variations in the power behavior are analyzed to isolate the infected gate(s). Experimental results on ISCAS benchmark circuits show that this approach can magnify the behavioral difference between a genuine and infected IC up to thirty times as compared to the previous approaches.