Title :
Traceable measurement of the electrical parameters of solid-state lighting products
Author :
Zhao, Dongbin ; Rietveld, Gert ; Braun, Jean-Pierre ; Overney, Frederic ; Lippert, Thomas ; Christensen, A.
Author_Institution :
VSL (Dutch Metrol. Inst.), Delft, Netherlands
Abstract :
In order to perform traceable measurements of the electrical parameters of solid-state lightning (SSL) products, it is essential to technically adequately define the measurement procedure and to identify the relevant uncertainty sources. This paper fills the related gaps in the present written standard for testing SSL products. New uncertainty sources with respect to conventional lighting sources are determined and their effects quantified. For power measurements on SSL products the main uncertainty sources are temperature dependence, power supply THD, and stabilization of the SSL product. For current rms measurements the influence of bandwidth, shunt resistor, power supply source impedance, and ac flatness error are significant as well.
Keywords :
electric current measurement; lighting; measurement uncertainty; power measurement; ac flatness error; bandwidth; current rms measurements; electrical parameters; power measurements; power supply THD; power supply source impedance; shunt resistor; solid-state lighting products; stabilization; temperature dependence; traceable measurement; uncertainty sources; Current measurement; Harmonic analysis; Measurement uncertainty; Power measurement; Power supplies; Uncertainty; electrical parameters; measurement; measurement uncertainty; solid-state lighting; traceability;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898553