DocumentCode
236575
Title
Traceable measurement of the electrical parameters of solid-state lighting products
Author
Zhao, Dongbin ; Rietveld, Gert ; Braun, Jean-Pierre ; Overney, Frederic ; Lippert, Thomas ; Christensen, A.
Author_Institution
VSL (Dutch Metrol. Inst.), Delft, Netherlands
fYear
2014
fDate
24-29 Aug. 2014
Firstpage
650
Lastpage
651
Abstract
In order to perform traceable measurements of the electrical parameters of solid-state lightning (SSL) products, it is essential to technically adequately define the measurement procedure and to identify the relevant uncertainty sources. This paper fills the related gaps in the present written standard for testing SSL products. New uncertainty sources with respect to conventional lighting sources are determined and their effects quantified. For power measurements on SSL products the main uncertainty sources are temperature dependence, power supply THD, and stabilization of the SSL product. For current rms measurements the influence of bandwidth, shunt resistor, power supply source impedance, and ac flatness error are significant as well.
Keywords
electric current measurement; lighting; measurement uncertainty; power measurement; ac flatness error; bandwidth; current rms measurements; electrical parameters; power measurements; power supply THD; power supply source impedance; shunt resistor; solid-state lighting products; stabilization; temperature dependence; traceable measurement; uncertainty sources; Current measurement; Harmonic analysis; Measurement uncertainty; Power measurement; Power supplies; Uncertainty; electrical parameters; measurement; measurement uncertainty; solid-state lighting; traceability;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location
Rio de Janeiro
ISSN
0589-1485
Print_ISBN
978-1-4799-5205-2
Type
conf
DOI
10.1109/CPEM.2014.6898553
Filename
6898553
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