DocumentCode :
2365947
Title :
Design and Implementation of Fine-Grain Power Gating with Ground Bounce Suppression
Author :
Usami, Kimiyoshi ; Shirai, Tokimasa ; Hashida, Tasunori ; Masuda, Hiroki ; Takeda, Seidai ; Nakata, Mitsutaka ; Seki, Naomi ; Amano, Hideharu ; Namiki, Mitaro ; Imai, Masashi ; Kondo, Masaaki ; Nakamura, Hiroshi
Author_Institution :
Shibaura Inst. of Technol., Saitama
fYear :
2009
fDate :
5-9 Jan. 2009
Firstpage :
381
Lastpage :
386
Abstract :
This paper describes a design and implementation methodology for fine-grain power gating. Since sleep-in and wakeup are controlled in a fine granularity in run time, shortening the transition time between the sleep and active states is strongly required. In particular, shortening the wakeup time is essential because it affects the execution time and hence does the performance. However, this requirement makes suppression of the ground-bounce more difficult. We propose a novel technique to skew the wakeup timings of fine-grain local power domains to suppress the ground bounce. Delay of buffers driving power switches is skewed in the buffer tree by selectively downsizing them. We designed a MIPS R3000 based CPU core in a 90 nm CMOS technology and applied our technique to internal function units. Simulation results showed that our technique reduces the rush current to 47% over the case to turn-on the power switches simultaneously. This resulted in suppressing the ground bounce to 53 mV with 3.3 ns wakeup time. Simulation results from running benchmark programs showed that the total power dissipation for the function units was reduced by up to 15% at 25degC and by 62% at 100degC. Effectiveness in power savings is discussed from the viewpoint of the temperature-dependent break-even points and the consecutive idle time in the program.
Keywords :
CMOS integrated circuits; buffer circuits; power semiconductor switches; CMOS technology; MIPS R3000 based CPU core; buffer tree; buffers driving power switches delay; fine-grain local power domain; fine-grain power gating; ground bounce suppression; power savings; running benchmark programs; rush current; size 90 nm; temperature 100 degC; temperature 25 degC; temperature-dependent break-even points; time 3.3 ns; total power dissipation; voltage 53 mV; Agriculture; CMOS technology; Central Processing Unit; Circuits; Delay; Logic design; Logic gates; Power dissipation; Switches; Very large scale integration; break-even point; delay-skewing; energy saving; ground bounce; power gating; wakeup time;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2009 22nd International Conference on
Conference_Location :
New Delhi
ISSN :
1063-9667
Print_ISBN :
978-0-7695-3506-7
Type :
conf
DOI :
10.1109/VLSI.Design.2009.63
Filename :
4749703
Link To Document :
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