Title :
Metric of the Application Environment Impact to the Passive UHF RFID System
Author :
Bing Li ; Yigang He ; Lei Zuo ; Ying Long
Author_Institution :
Sch. of Electr. & Autom. Eng., Hefei Univ. of Technol., Hefei, China
Abstract :
Passive ultrahigh frequency (UHF) radio frequency identification (RFID) is a powerful automatic contactless identification technique that has numerous applications. The performance of passive UHF RFID system is affected seriously by the application environments. In this paper, we propose a metrical method of application environment impact for passive UHF RFID system based on fuzzy comprehensive evaluation. The metric of application environment impact is graded by the degradation of reading distance, reading rate, and reading speed of passive UHF RFID system. Analytic hierarchy process is used to calculate the weight of factors, which reduces the subjectivity of evaluation results. For avoiding the loss of valid information, weighted average operator is employed to replace traditional max min operator. The end user can know the real performance of product selected by the grade of application environment impact visually and easily use the method proposed. Experimental results indicate that the proposed method is simple, valid, fast, accurate, and practical.
Keywords :
analytic hierarchy process; fuzzy set theory; radiofrequency identification; analytic hierarchy process; automatic contactless identification technique; fuzzy comprehensive evaluation; metrical method; passive UHF RFID system; passive ultrahigh frequency radio frequency identification; weighted average operator; Indexes; Materials; Passive RFID tags; Performance evaluation; Radio frequency; Analytic hierarchy process (AHP); application environment impact; fuzzy comprehensive evaluation (FCE); metric; radio frequency identification (RFID);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2013.2287119