Title :
Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers
Author :
Lim, L.C. ; Kumar, F.J.
Author_Institution :
Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
A multi-probe non-destructive evaluation technique for quantifying the distribution of Curie temperature of large-size relaxor single crystal wafers is described. The results show that through selective dicing with the aid of the proposed non-destructive test, it is possible to produce large-area (say, 20×15 mm or larger) inclusion-free lead zinc niobate-lead titanate solid-solution (or PZN-PT) single crystal wafers with a narrow TC distribution (i.e. ±1.5°C), hence of consistent composition and properties, from (001) layer growth dominated flux-grown single crystals. Typical TC variations between wafers are estimated at ±1.5°C
Keywords :
Curie temperature; nondestructive testing; piezoelectric materials; probes; temperature distribution; temperature measurement; Curie temperature distribution; NDT; PZN-PT single crystal; PbZnNbTiO3; large-size relaxor single crystal wafers; multi-probe nondestructive evaluation; nondestructive test; selective dicing; solid-solution; Cooling; Crystals; Electrodes; Materials science and technology; Mechanical engineering; Nondestructive testing; Phased arrays; Temperature distribution; Titanium compounds; Zinc;
Conference_Titel :
Ultrasonics Symposium, 2001 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-7177-1
DOI :
10.1109/ULTSYM.2001.991898
