DocumentCode
2366275
Title
[Copyright notice]
fYear
2010
fDate
6-8 Dec. 2010
Firstpage
1
Lastpage
1
Abstract
The following topics are dealt with: CMOS devices; reliability; quantum power devices; compound semiconductor devices; displays; sensors; MEMS; memory technology; modelling and simulation; solid-state devices; and nanoelectronic devices.
Keywords
CMOS integrated circuits; display instrumentation; micromechanical devices; nanoelectronics; reliability; semiconductor devices; sensors; storage management chips; CMOS devices; MEMS; compound semiconductor devices; displays; memory technology; nanoelectronic devices; quantum power devices; reliability; sensors; solid-state devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4424-7418-5
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2010.5703219
Filename
5703219
Link To Document