Title :
[Copyright notice]
Abstract :
The following topics are dealt with: CMOS devices; reliability; quantum power devices; compound semiconductor devices; displays; sensors; MEMS; memory technology; modelling and simulation; solid-state devices; and nanoelectronic devices.
Keywords :
CMOS integrated circuits; display instrumentation; micromechanical devices; nanoelectronics; reliability; semiconductor devices; sensors; storage management chips; CMOS devices; MEMS; compound semiconductor devices; displays; memory technology; nanoelectronic devices; quantum power devices; reliability; sensors; solid-state devices;
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2010.5703219
