Title :
Simple broadband anti-reflective coatings for superstrate-type silicon-based tandem cells
Author :
Kuo, Ting-Wei ; Chang, Ping-Kuan ; Yang, Yu-Shuang ; Houng, Mau-Phon ; Wang, Na-Fu ; Tsai, Yu-Zen
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
In this paper, the superstrate-type silicon-based tandem cells between air and glass are added to a porous SiO2/MgF2 double-layer anti-reflective (DLAR) thin film structure in order to improve the glass substrate low reflectivity in a wide spectral range (400-1200 nm), without high reflectivity in the near-infrared region. Practical discussion is presented, as well as experimental results of fabricated films and devices. Application of the experimental porous SiO2/MgF2 DLAR thin film to conventional silicon-based tandem solar cells results in improvement of the short-circuit current density by 6.82%. Solar cell efficiency is improved by 7.14%. The presented experimental porous SiO2/MgF2 DLAR thin film structure provides anti-reflective results in a broad range of visible light, without high reflectivity at near-infrared wavelengths.
Keywords :
antireflection coatings; current density; elemental semiconductors; magnesium compounds; metallic thin films; porous materials; reflectivity; semiconductor thin films; short-circuit currents; silicon compounds; solar cells; DLAR thin film; Si-SiO2-MgF2; SiO2; broadband antireflective coating; fabricated devices; fabricated films; glass substrate; low reflectivity; magnesium fluoride; near-infrared region; near-infrared wavelength; porous SiO2-MgF2 double-layer antireflective thin film; reflectivity; short-circuit current density; silicon dioxide; silicon-based tandem solar cell; superstrate-type silicon-based tandem cells; wide spectral range; Coatings; Films; Glass; Photovoltaic cells; Reflectivity; Refractive index; Substrates; anti-reflective; broadband; magnesium fluoride; silicon dioxide; silicon-based tandem cells; superstrate-type;
Conference_Titel :
Environment and Electrical Engineering (EEEIC), 2012 11th International Conference on
Conference_Location :
Venice
Print_ISBN :
978-1-4577-1830-4
DOI :
10.1109/EEEIC.2012.6221409
