Title :
Measurements of ESD HBM events, simulator radiation and other characteristics toward creating a more repeatable simulation or; simulators should simulate
Author :
Barth, Jon ; Dale, Dave ; Hall, Ken ; Hyatt, Hugh ; McCarthy, Darren ; Nuebel, Joe ; Smith, Doug
Author_Institution :
Barth Electron. Inc., Boulder City, NV, USA
Abstract :
Significant differences in test results are found when more than one brand of ESD simulator is used for immunity testing of electronic equipment. These problems prompted this work on fundamental measurements of ESD events and ESD simulators. This paper describes the characteristics of the special equipment designed for the measurements, describes the measurements, and compares the measurements to evaluate the effects of ESD testing repeatability.
Keywords :
electronic equipment testing; electrostatic discharge; ESD HBM events; electronic equipment; immunity testing; measurement; simulator radiation; Electronic equipment testing; Electrostatic discharges; Electrostatic measurements;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 1996. Proceedings
Print_ISBN :
1-878303-69-4
DOI :
10.1109/EOSESD.1996.865144