DocumentCode :
2366754
Title :
Study on preparation and antibacterial property of Cu/TiO2 composite nanoparticles
Author :
Hu, Y.L. ; Liu, H.F. ; Chen, W.R. ; Guo, X.P. ; Chen, D.B. ; Hu, J.H.
fYear :
2008
fDate :
24-27 March 2008
Firstpage :
402
Lastpage :
406
Abstract :
Cu/TiO2 composite nanoparticles were prepared by photoreduction deposition methods. The properties of the nanoparticles were widely characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM) equipped with energy dispersive X-ray spectroscopy (EDS). Moreover, the antibacterial performances were performed by zone of inhibition (ZOI) tests against the bacteria species. The results suggested that the pH value had great influence on the properties of Cu/TiO2 composite nanoparticles. Cu element tends to exist as Cu2O when the pH is high, but Cu element does as pure Cu phase when pH value is low. With the increase of UV irradiation time, Cu phases are subsequently oxidized to Cu2O, and the amount of Cu2O in composite nanoparticles increased. The antibacterial activities of composite nanoparticles against Staphylococcus aureus are well and enhanced with the increase of the Cu2O amount. The synergistic effect was found between Cu and TiO2.
Keywords :
X-ray chemical analysis; X-ray diffraction; antibacterial activity; catalysts; copper; microorganisms; nanocomposites; nanoparticles; nanotechnology; oxidation; pH; photochemistry; titanium compounds; transmission electron microscopy; ultraviolet radiation effects; Cu-TiO2; Cu2O; EDS; Staphylococcus aureus; TEM; UV irradiation; X-ray diffraction; XRD; antibacterial properties; composite nanoparticles; energy dispersive X-ray spectroscopy; oxidization; pH value; photoreduction deposition methods; transmission electron microscopy; Anti-bacterial; Dispersion; Microorganisms; Nanoparticles; Performance evaluation; Spectroscopy; Testing; Transmission electron microscopy; X-ray diffraction; X-ray scattering; Cu/TiO2 composite nanoparticles; antibacterial performance; photoreduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1572-4
Electronic_ISBN :
978-1-4244-1573-1
Type :
conf
DOI :
10.1109/INEC.2008.4585515
Filename :
4585515
Link To Document :
بازگشت