An investigation into the performance of the IEC 1000-4-4 capacitive clamp

Author

Smith, Douglas C.

Author_Institution

Auspex Syst., Santa Clara, CA, USA

fYear

1996

fDate

10-12 Sept. 1996

Firstpage

223

Lastpage

226

Abstract

The IEC 1000-4-4 Electrical Fast Transient test, like ESD, is a severe pulsed EMI immunity test. Data presented shows that the test may be too severe and contains repeatability problems that causes excessive cost to be added to designs. In addition, a common mistake in application of the test is shown to double the stress on the equipment being tested.

Keywords

electromagnetic interference; electronic equipment testing; electrostatic discharge; transient analysis; ESD; IEC 1000-4-4 capacitive clamp; electrical fast transient test; pulsed EMI immunity test; Electromagnetic interference; Electromagnetic measurements; Electromagnetic transient analysis; Electronic equipment testing; Electrostatic discharges;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium, 1996. Proceedings

Print_ISBN

1-878303-69-4

Type

conf

DOI

10.1109/EOSESD.1996.865145

Filename

865145

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2366770