DocumentCode :
2366807
Title :
Antireflective sub-wavelength gratings fabricated by UV-NIL
Author :
Li, Miaoli ; Wang, Qingkang ; Shen, Jun ; Liu, Yanbo ; Zhu, Zhaoying ; Wan, Yongzhong ; Niu, Xiaoming
Author_Institution :
Shanghai Nanotechnol. Promotion Center, Shanghai
fYear :
2008
fDate :
24-27 March 2008
Firstpage :
415
Lastpage :
421
Abstract :
Sub-wavelength gratings (SWGs) have been widely used in many fields since the structure has the function of antireflection and increase the light transmittance. Many researchers are fabricating SWGs on the glass substrate hoping that it can be used in solar cells, display or light emit diodes (LEDs). Nanoimprint is an emerging lithographic technology that promises high resolution, high throughput, and low cost patterning of nanostructures. In this paper, an antireflective SWGs on a quartz substrate with transparent resist by UV nanoimprint lithography (NIL) is fabricated. The transmittance at the wavelengths from 1000 nm to 2000 nm were measured and compared with the same substrate without SWGs pattern. The results show that the SWGs pattern increases the transmittance by about 1.5%.
Keywords :
antireflection coatings; atomic force microscopy; diffraction gratings; infrared spectra; light transmission; nanolithography; photoresists; quartz; spin coating; ultraviolet lithography; AFM; SiO2; UV-cured transparent resist deposition; UV-nanoimprint lithography; antireflective sub-wavelength gratings; light transmittance; quartz substrate; replication structure; rigid quartz stamp; spin coating technique; wavelength 1000 nm to 2000 nm; Costs; Displays; Glass; Gratings; Light emitting diodes; Nanostructures; Photovoltaic cells; Reluctance generators; Resists; Throughput; Sub-wavelength gratings (SWGs); UVNanoimprint lithography (UV-NIL); photorisist; stamp;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1572-4
Electronic_ISBN :
978-1-4244-1573-1
Type :
conf
DOI :
10.1109/INEC.2008.4585518
Filename :
4585518
Link To Document :
بازگشت