• DocumentCode
    2366872
  • Title

    Impact of connecting a CSP plant in the upington distribution network on voltage dip performance

  • Author

    Xezile, Ronald ; Mbuli, Nhlanhla ; Pretorius, JHC

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Johannesburg, Johannesburg, South Africa
  • fYear
    2012
  • fDate
    18-25 May 2012
  • Firstpage
    537
  • Lastpage
    542
  • Abstract
    The Upington area within South Africa is well-endowed with solar resources, with relatively high annual solar radiation recorded compared to other parts of the country. The distribution network in the area comprises very long lines, has very low fault levels, and is very prone to voltage dips. Previous studies [1] have investigated the feasibility and network considerations of connecting concentrating solar power (CSP) plants of sizes 50 MW, 100 MW and 150 MW at Upington substation. In this paper, the previous work is extended to assess the impact of connecting the plant sizes described above on the voltage dip performance of this weak network. The studies show that embedding a CSP plant in such a weak network, apart from capacity-related benefits, can have positive on quality of supply of such a system by reducing the severity of dips due to disturbances.
  • Keywords
    distribution networks; power supply quality; solar power stations; solar radiation; CSP plant; Upington distribution network; Upington substation; capacity-related benefits; concentrating solar power plants; feasibility considerations; network considerations; plant sizes; power 100 MW; power 150 MW; power 50 MW; relatively high annual solar radiation; solar resources; voltage dip performance; weak network; Power system dynamics; Power system stability; Stability analysis; Substations; Transient analysis; Voltage fluctuations; power quality; transient stability; voltage dip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2012 11th International Conference on
  • Conference_Location
    Venice
  • Print_ISBN
    978-1-4577-1830-4
  • Type

    conf

  • DOI
    10.1109/EEEIC.2012.6221435
  • Filename
    6221435