• DocumentCode
    2366951
  • Title

    Effects of different annealing treatments on soft magnetic properties of Finemet alloy

  • Author

    Long, Lance ; Yan, Bin ; Guan, L.-d. ; Yang, Songping ; Chen, Zi-Hau

  • Author_Institution
    Shanghai Key Lab. of D&A for Metal-Functional Mater., Shanghai
  • fYear
    2008
  • fDate
    24-27 March 2008
  • Firstpage
    458
  • Lastpage
    461
  • Abstract
    Amorphous ribbon of Finemet alloy was obtained by rapid quenching from the melt spinning technique. Normal heat treatment and longitudinal magnetic field heat treatment methods were applied to anneal the Finemet amorphous ribbon. Microstructures of the annealed ribbons were detected by XRD. XRD results showed that nanocrystalline alpha-Fe(Si) phase formed in the amorphous matrix after both annealing treatments, resulting in the nanocrystalline / amorphous two-phase structure. Soft magnetic properties of the annealed ribbons were tested by TPS-200SA Soft Exchange Tester. It was found that soft magnetic properties were greatly improved by both annealing treatment methods, especially after the longitudinal magnetic field heat treatment, the hysteresis loop was transformed to near-rectangle shape, with the magnetic permeability mu greatly improved.
  • Keywords
    X-ray diffraction; amorphous magnetic materials; annealing; boron alloys; copper alloys; ferromagnetic materials; iron alloys; magnetic hysteresis; magnetic permeability; nanostructured materials; niobium alloys; quenching (thermal); silicon alloys; soft magnetic materials; Fe73.5CuNb3Si13.5B9; Finemet alloy; XRD; amorphous matrix; amorphous ribbon; amorphous two-phase structure; annealing treatments; heat treatment; hysteresis loop; magnetic permeability; melt spinning technique; microstructures; nanocrystalline phase; rapid quenching; soft magnetic properties; Amorphous materials; Annealing; Heat treatment; Magnetic fields; Magnetic hysteresis; Magnetic properties; Microstructure; Spinning; Testing; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1572-4
  • Electronic_ISBN
    978-1-4244-1573-1
  • Type

    conf

  • DOI
    10.1109/INEC.2008.4585527
  • Filename
    4585527
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2366951