DocumentCode :
2366976
Title :
Leveraging infrastructure IP for SoC yield
Author :
Zorian, Yervant
Author_Institution :
Virage Logic Corp., Fremont, CA, USA
fYear :
2003
fDate :
16-19 Nov. 2003
Firstpage :
3
Lastpage :
4
Abstract :
Summary form only given. In addition to the functional IP cores, today´s SoC necessitates embedding a special family of IP blocks, called infrastructure IP blocks. These are meant to ensure the manufacturability of the SoC and to achieve adequate levels of yield and reliability. The infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This keynote address analyzes the key trends and challenges resulting in manufacturing susceptibility and field reliability that necessitate the use of such infrastructure IP. Then, it concentrates on certain examples of such embedded IPs for detection, analysis and correction.
Keywords :
industrial property; integrated circuit design; integrated circuit reliability; integrated circuit yield; system-on-chip; SoC yield; analysis IP; correction IP; detection embedded IP; field reliability; functional IP cores; infrastructure IP blocks; manufacturability; manufacturing knowledge feedback; manufacturing susceptibility; Automatic testing; Electronics industry; Fabrication; Feeds; Integrated circuit design; Integrated circuit reliability; Logic; Manufacturing; Production; Prototypes; Semiconductor device manufacture; Semiconductor device reliability; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-1951-2
Type :
conf
DOI :
10.1109/ATS.2003.1250771
Filename :
1250771
Link To Document :
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