Title :
Exhaustive test of several dependable memory architectures designed by GRAAL tool
Author :
Bertuccelli, F. ; Bigongiari, F. ; Brogna, A.S. ; Natale, G. Di ; Prinetto, P. ; Saletti, R.
Author_Institution :
Aurelia Microelettronica S.p.A, Navacchio, Italy
Abstract :
This paper presents a customizable injection fault system and performance evaluations of dependable memory collars designed by GRAAL tool. The novelty consists in a large number of tests and architecture comparisons which can demonstrate the efficiency and validity of GRAAL and how it helps the designer to experiment the architecture sensitivity and evaluate changes in performances when a particular dependable memory collar is chosen or bypassed. Moreover, a complete test set-tip and real case study where the memory interacts in a complex system is described The system collects information to measure the effects of fault detection and fault tolerance. The hardware is assembled in a configurable test board with a FPGA where are one of several memory wrapper which GRAAL generates and a serial link to receive and send data from an acquisition system. Two commercial Personal Computers interact thought the boards and collect data from the experiment.
Keywords :
DRAM chips; SRAM chips; built-in self test; design for testability; embedded systems; fault diagnosis; integrated circuit testing; space vehicle electronics; BIST; DRAM; FPGA device; GRAAL tool; SRAM; complex system; configurable test board; customizable injection fault system; data memory; dependable memory architectures; embedded systems; fault coverage; fault detection; fault tolerance; memory collar; memory testing; performance evaluations; Automatic testing; Built-in self-test; DRAM chips; Design for testability; Electrical fault detection; Encoding; Error correction; Fault detection; Fault diagnosis; Integrated circuit testing; Logic testing; Memory architecture; Random access memory; Read-write memory; SRAM chips; Self-testing; Space vehicle electronics;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250779
