Title :
On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios
Author :
Tang, Huaxing ; Wang, Chen ; Rajski, Janusz ; Reddy, Sudhakar M. ; Tyszer, Jerzy ; Pomeranz, Irith
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., IA, USA
Abstract :
We propose an enhanced selective compaction scheme, which integrates three techniques, called selectively filled tests, selective chains masking and selective chains observation, to reduce the impact of unknown values on the test response compaction ratio. Experimental results on several industrial designs demonstrate the effectiveness of the proposed scheme in achieving a very high test response compaction ratio without compromising the test quality.
Keywords :
automatic test pattern generation; data compression; integrated circuit testing; logic testing; efficient X-handling; high test response compaction ratio; selective chains masking; selective chains observation; selective compaction; selectively filled tests; test quality; Circuit faults; Circuit testing; Cities and towns; Compaction; Fault detection; Flip-flops; Graphics; Joining processes; Linear circuits; Test data compression;
Conference_Titel :
VLSI Design, 2005. 18th International Conference on
Print_ISBN :
0-7695-2264-5
DOI :
10.1109/ICVD.2005.127
