DocumentCode
2367120
Title
On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios
Author
Tang, Huaxing ; Wang, Chen ; Rajski, Janusz ; Reddy, Sudhakar M. ; Tyszer, Jerzy ; Pomeranz, Irith
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa Univ., IA, USA
fYear
2005
fDate
3-7 Jan. 2005
Firstpage
59
Lastpage
64
Abstract
We propose an enhanced selective compaction scheme, which integrates three techniques, called selectively filled tests, selective chains masking and selective chains observation, to reduce the impact of unknown values on the test response compaction ratio. Experimental results on several industrial designs demonstrate the effectiveness of the proposed scheme in achieving a very high test response compaction ratio without compromising the test quality.
Keywords
automatic test pattern generation; data compression; integrated circuit testing; logic testing; efficient X-handling; high test response compaction ratio; selective chains masking; selective chains observation; selective compaction; selectively filled tests; test quality; Circuit faults; Circuit testing; Cities and towns; Compaction; Fault detection; Flip-flops; Graphics; Joining processes; Linear circuits; Test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2005. 18th International Conference on
ISSN
1063-9667
Print_ISBN
0-7695-2264-5
Type
conf
DOI
10.1109/ICVD.2005.127
Filename
1383254
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