DocumentCode :
2367131
Title :
A Novel Diode Structure with Controlled Injection of Backside Holes (CIBH)
Author :
Chen, Min ; Lutz, Josef ; Domeij, M. ; Felsl, Hans Peter ; Schulze, Hans-Joachim
Author_Institution :
Chemnitz Univ. of Technol.
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, we present a novel 3.3kV diode structure with controlled injection of backside holes, i.e. CIBH diode. This new diode structure features buried floating p layers at the cathode side. These p doped areas prevent the formation of high electric field strength at the nn+ junction and accordingly avoid the avalanche generation at the nn+ junction. The CIBH diode concept provides, compared to diodes without p layers and the same design, significantly improved dynamic ruggedness and improved soft reverse recovery at low current densities. Simulations and results of the first fabricated diodes show the realizability of this new promising diode concept
Keywords :
p-i-n diodes; power semiconductor diodes; semiconductor doping; 3.3 kV; CIBH; buried floating p layers; controlled injection of backside holes; diode structure; dynamic ruggedness; low current densities; n-n+ junction; soft reverse recovery; Avalanche breakdown; Cathodes; Character generation; Chemical technology; Circuits; Clamps; Current density; Diodes; Electromagnetic interference; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on
Conference_Location :
Naples
Print_ISBN :
0-7803-9714-2
Type :
conf
DOI :
10.1109/ISPSD.2006.1666058
Filename :
1666058
Link To Document :
بازگشت