Title :
A Hierarchical Model for Reliability Analysis of Sensor Networks
Author :
Kim, Dong Seong ; Ghosh, Rahul ; Trivedi, Kishor S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Abstract :
This paper presents a comprehensive approach for reliability analysis of a clusterbased sensor network. A three-level hierarchical model is used for sensor networks using fault trees and use Markov chains at the bottom level to model the reliability of individual sensor nodes. The model can capture the hardware/software failures of a sensor node, failures of clusters and base station as well as channel failure. We summarize the developed models, showcase the initial numerical results and outline the future avenues of research in the following sections.
Keywords :
Markov processes; fault trees; system recovery; telecommunication network reliability; wireless sensor networks; Markov chains; channel failure; cluster based sensor network; fault tree; hardware failure; reliability analysis; sensor nodes; software failure; three-level hierarchical model; Hierarchical Model; Reliability; Sensor Network;
Conference_Titel :
Dependable Computing (PRDC), 2010 IEEE 16th Pacific Rim International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-8975-6
Electronic_ISBN :
978-0-7695-4289-8
DOI :
10.1109/PRDC.2010.25
