• DocumentCode
    2367154
  • Title

    A Hierarchical Model for Reliability Analysis of Sensor Networks

  • Author

    Kim, Dong Seong ; Ghosh, Rahul ; Trivedi, Kishor S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • fYear
    2010
  • fDate
    13-15 Dec. 2010
  • Firstpage
    247
  • Lastpage
    248
  • Abstract
    This paper presents a comprehensive approach for reliability analysis of a clusterbased sensor network. A three-level hierarchical model is used for sensor networks using fault trees and use Markov chains at the bottom level to model the reliability of individual sensor nodes. The model can capture the hardware/software failures of a sensor node, failures of clusters and base station as well as channel failure. We summarize the developed models, showcase the initial numerical results and outline the future avenues of research in the following sections.
  • Keywords
    Markov processes; fault trees; system recovery; telecommunication network reliability; wireless sensor networks; Markov chains; channel failure; cluster based sensor network; fault tree; hardware failure; reliability analysis; sensor nodes; software failure; three-level hierarchical model; Hierarchical Model; Reliability; Sensor Network;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing (PRDC), 2010 IEEE 16th Pacific Rim International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-8975-6
  • Electronic_ISBN
    978-0-7695-4289-8
  • Type

    conf

  • DOI
    10.1109/PRDC.2010.25
  • Filename
    5703260