DocumentCode :
2367213
Title :
An analytic potential-based model for undoped nanoscale surrounding-gate MOSFETs
Author :
Bian, Wei ; He, Jin ; Tao, Yadong ; Fang, Min ; Feng, Jie
Author_Institution :
Shenzhen Grad. Sch., Sch. of Comput. & Inf. Eng., Peking Univ., Beijing
fYear :
2008
fDate :
24-27 March 2008
Firstpage :
509
Lastpage :
514
Abstract :
An analytic potential-based model for the undoped surrounding-gate MOSFETs is derived in the paper. The model is obtained from solving Poisson equation rigorously together with the drain current formulation equivalent to Pao-Sahpsilas double integral previously proposed for long-charnel bulk MOSFETs. The model gives a fully self-consistent physical description for the channel potential, charge and current that is valid for the sub threshold, linear and saturation regions. The validity of the proposed model has been verified by extensive comparison with the exact numerical integrations and 3-D numerical simulation , demonstrating the modelpsilas accuracy and prediction capability.
Keywords :
MOSFET; nanotechnology; 3-D numerical simulation; Pao-Sahpsilas double integral; Poisson equation; channel potential; drain current formulation; self-consistent physical description; undoped nanoscale surrounding-gate MOSFETs; MOSFETs; Nanoelectronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1572-4
Electronic_ISBN :
978-1-4244-1573-1
Type :
conf
DOI :
10.1109/INEC.2008.4585538
Filename :
4585538
Link To Document :
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