DocumentCode :
2367217
Title :
Cellular automata based test structures with logic folding
Author :
Sikdar, Biplab K. ; Das, Sukanta ; Roy, Samir ; Ganguly, Niloy ; Das, Debesh K.
Author_Institution :
Comput. Sci. & Technol., Bengal Eng. & Sci. Univ., West Bengal, India
fYear :
2005
fDate :
3-7 Jan. 2005
Firstpage :
71
Lastpage :
74
Abstract :
This work presents an efficient test solution for VLSI circuits. The test structure is designed with GF(2P) CA. The introduction to an innovative scheme of logic folding optimizes the cost of test logic that can not be feasible with the flattened structure of GF(2) CA/LFSR.
Keywords :
Galois fields; VLSI; cellular automata; integrated circuit testing; logic testing; optimisation; VLSI circuits; cellular automata based test structures; logic folding; test logic cost optimization; Automatic testing; Built-in self-test; Circuit testing; Computer science; Design engineering; Logic circuits; Logic design; Logic testing; Polynomials; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2005. 18th International Conference on
ISSN :
1063-9667
Print_ISBN :
0-7695-2264-5
Type :
conf
DOI :
10.1109/ICVD.2005.63
Filename :
1383256
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2367217
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