DocumentCode
2367225
Title
Nanoelectronic circuit architectures based on single-electron turnstiles
Author
Zhang, Wancheng ; Wu, Nan-Jian
Author_Institution
State Key Lab. for Superlattices & Microstruct., Chinese Acad. of Sci., Beijing
fYear
2008
fDate
24-27 March 2008
Firstpage
515
Lastpage
519
Abstract
Single-electron devices (SEDs) have ultra-low power dissipation and high integration density, which make them promising candidates as basic circuit elements of the next generation VLSI circuits. In this paper, we propose two novel circuit single-electron architectures: the single-electron simulated annealing algorithm (SAA) circuit and the single-electron cellular neural network (CNN). We used the MOSFET-based single-electron turnstile as the basic circuit element. The SAA circuit consists of the voltage-controlled single-electron random number generator and the single-electron multiple-valued memories (SEMVs). The random-number generation and variable variations in SAA are easily achieved by transferring electrons using the single-electron turnstile. The CNN circuit used the floating-gate single-electron turnstile as the neural synapses, and the number of electrons is used to represent the cells states. These novel circuits are promising in future nanoscale integrated circuits.
Keywords
MOSFET circuits; VLSI; cellular neural nets; nanoelectronics; random number generation; simulated annealing; single electron devices; MOSFET single-electron turnstile; VLSI circuits; floating-gate single-electron turnstile; nanoelectronic circuit architecture; nanoscale integrated circuits; single-electron architecture; single-electron cellular neural network; single-electron devices; single-electron multiple-valued memory; single-electron simulated annealing algorithm circuit; single-electron turnstiles; voltage-controlled single-electron random number generator; Circuits; Nanoelectronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
Conference_Location
Shanghai
Print_ISBN
978-1-4244-1572-4
Electronic_ISBN
978-1-4244-1573-1
Type
conf
DOI
10.1109/INEC.2008.4585539
Filename
4585539
Link To Document