Automated TTCN-3 test case generation by means of UML sequence diagrams and Markov chains

Author

Beyer, Matthias ; Dulz, Winfried ; Zhen, Fenhua

Author_Institution

Inst. for Comput. Sci., Erlangen-Nurnberg Univ., Erlangen, Germany

fYear

2003

fDate

16-19 Nov. 2003

Firstpage

102

Lastpage

105

Abstract

The objective of this paper is to automatically generate a MCUM (Markov chain usage model) starting from an OMG UML-SD (sequence diagram) in order to derive TTCN-3 (testing and test control notation version 3) compatible test case definitions. Our approach is a combination of statistical usage testing and specification-based testing. Within this paper, special attention is given to international standardized FDT notations, specifically UML-SD and MSC. We have also defined an XML-based representation format called MCML (Markov chain markup language) to build a common interface between various parts of the MaTeLo tool set. In the case of UML-SD, we use XMI descriptions in order to generate the desired MCML format.

Keywords

Markov processes; XML; program testing; specification languages; MCML format; MCUM; MSC; MaTeLo tool set common interface; Markov chain markup language; Markov chain usage model; Markov test logic; OMG UML-SD; TTCN-3 compatible test case definitions; UML sequence diagrams; XMI descriptions; XML-based representation format; automated TTCN-3 test case generation; international standardized FDT notations; sequence diagram; software testing; specification-based testing; statistical usage testing; testing and test control notation version 3; Automatic generation control; Automatic testing; Computer science; Logic testing; Markov processes; Markup languages; Reliability; Software testing; Specification languages; Statistical analysis; System testing; Unified modeling language;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2003. ATS 2003. 12th Asian

ISSN

1081-7735

Print_ISBN

0-7695-1951-2

Type

conf

DOI

10.1109/ATS.2003.1250791

Filename

1250791