Title :
Issues related to the formulation of DFT solution for analog circuit test using equivalent fault analysis
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, China
Abstract :
This paper identifies a few important points at which the application of equivalent fault analysis becomes the preferred choice in formulating a DFT solution for analog circuit test. These issues are important in that the test and/or design engineer should be aware of them in order to come up with effective test solutions to enhance fault diagnosis.
Keywords :
circuit testing; design for testability; fault diagnosis; DFT; analog circuit test; equivalent fault analysis; fault collapsing criteria; fault diagnosis; Analog circuits; Circuit analysis; Circuit analysis computing; Circuit faults; Circuit testing; Design for testability; Electronic equipment testing; Fault diagnosis; Information analysis; Operational amplifiers; Resistors;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250795
