DocumentCode
2367480
Title
A Novel Cost-Effective Disk Scrubbing Scheme
Author
Liu, Junping ; Zhou, Ke ; Pang, Liping ; Wang, Zhikun ; Deng, Yuhui ; Feng, Dan
Author_Institution
Sch. of Compute Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2009
fDate
25-27 Aug. 2009
Firstpage
686
Lastpage
691
Abstract
A distinct benefit of disk scanning or scrubbing operation is identifying the potential failure sectors as early as possible, thus providing high reliability. Obviously, the higher the scrubbing frequency is, the higher the system reliability is. However, it may take a few hours for a scanning process to check the whole disk. In other words, the scrubbing process may result in a downtime or a lower system performance. Furthermore, the scrubbing process consumes energy. In order to reduce the impact of disk scrubbing on disk performance and energy consumption, system designers choose to scan the disk in a low frequency, which results in a lower reliability. Additionally, conventional disk scrubbing schemes assume that the disk failure rate is constant, while the recent researches show the disk failure rate is more complex. In this paper, we present a novel scrubbing scheme to solve the above challenges. In the scheme, an optimum scrubbing cycle is decided by keeping a balance between data loss cost, scrubbing cost, and disk failure rate. Our research shows that the scrubbing scheme is applicable for storage with low-capacity disk and inexpensive data.
Keywords
disc drives; disc storage; reliability; cost-effective disk scrubbing scheme; data loss cost; disk drives; disk failure rate; disk scanning; energy consumption; system designers; system reliability; Cost function; Electromagnetic compatibility; Energy consumption; Frequency; Large-scale systems; Maintenance; Protection; Redundancy; Reliability; System performance; Disk Scanning; Disk Scrubbing; RAID; Storage;
fLanguage
English
Publisher
ieee
Conference_Titel
INC, IMS and IDC, 2009. NCM '09. Fifth International Joint Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4244-5209-5
Electronic_ISBN
978-0-7695-3769-6
Type
conf
DOI
10.1109/NCM.2009.26
Filename
5331807
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