Title :
A new and easy approach to create BCI models
Author :
Oganezova, I. ; Bunlon, X. ; Gheonjian, A. ; Chahine, I. ; Khvitia, Badri ; Jobava, R.
Author_Institution :
EMCoS Ltd., Tbilisi, Georgia
Abstract :
In this article, new lumped-parameter models of current clamps are proposed and discussed. The models were extracted from measured S parameters of a clamp mounted onto a calibration fixture. The generated bulk current injection (BCI) and current probe simulation models were used in the electromagnetic (EMC) testing of a realistic cable harness according to the ISO 11452-4 standard. The accuracy and efficiency of the proposed simulation model were estimated by comparing the simulated results with measured data.
Keywords :
ISO standards; calibration; electromagnetic compatibility; fixtures; BCI models; EMC testing; ISO 11452-4 standard; bulk current injection; calibration fixture; electromagnetic testing; lumped-parameter models; Current measurement; FCC; Impedance; Impedance measurement; Integrated circuit modeling; Probes; Wires; SPICE model; bulk current injection (BCI); conducted susceptibility; current probes;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6898949
