Title :
Modeling electromagnetic radiation at high-density PCB/connector interfaces
Author :
Xinxin Tian ; Halligan, Matthew ; Xiao Li ; Kiyeong Kim ; Hung-Chuan Chen ; Connor, Samuel ; Archambeault, Bruce ; Cracraft, M. ; Ruehli, Albert ; Drewniak, James
Author_Institution :
Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
Electromagnetic radiation for a commercial printed circuit board (PCB) connector is investigated in this paper. The simulation models of the connector are shown to be validated by comparing measured and simulated S-parameters. Analytical formulas are provided to calculate the total loss and the radiated power from a PCB/connector structure when material losses are known. The total power loss for the considered geometry is shown to be dominated by material loss rather than radiated power loss. Termination schemes and additional geometry details in the connector model are also studied for their effects on the radiated power.
Keywords :
S-parameters; electromagnetic waves; printed circuit interconnections; Electromagnetic radiation; S-parameters; electromagnetic radiation; high-density PCB-connector interfaces; material loss; radiated power; total power loss; Conductors; Connectors; Dielectrics; Materials; Ports (Computers); Scattering parameters; Semiconductor device modeling; Connectors; Electromagnetic radiation; Printed circuit board connectors; Radiated power; Scattering parameters;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6898950