• DocumentCode
    2367628
  • Title

    Phase Noise Simulation and Modeling of ADPLL by SystemVerilog

  • Author

    Wen, Tingjun ; Kwasniewski, Tad

  • Author_Institution
    Integrated Device Technol., Ottawa, ON
  • fYear
    2008
  • fDate
    25-26 Sept. 2008
  • Firstpage
    29
  • Lastpage
    34
  • Abstract
    Event driven phase noise simulation and modeling of an ADPLL by SystemVerilog is presented in this paper. It uses the simple Stochastic Voss-McCartney algorithm to generate the pink noise so that the 1/f phase noise effect can be easily modeled. Since the event driven simulation is extremely fast compared to the circuit level simulation, it allows circuit designers to explore different ADPLL architectures at the early stage without going through the time-consuming circuit level simulation. Pure SystemVerilog implementation also makes it possible to simulate the phase noise effect of the ADPLL efficiently in a large SOC system.
  • Keywords
    1/f noise; digital phase locked loops; system-on-chip; 1/f phase noise effect; ADPLL; SystemVerilog; large SOC system; phase locked loop; phase noise simulation; stochastic Voss-McCartney algorithm; 1f noise; Circuit noise; Circuit simulation; Discrete event simulation; Hardware design languages; Noise generators; Phase locked loops; Phase noise; System-on-a-chip; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Behavioral Modeling and Simulation Workshop, 2008. BMAS 2008. IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2896-0
  • Type

    conf

  • DOI
    10.1109/BMAS.2008.4751235
  • Filename
    4751235