Title :
Phase Noise Simulation and Modeling of ADPLL by SystemVerilog
Author :
Wen, Tingjun ; Kwasniewski, Tad
Author_Institution :
Integrated Device Technol., Ottawa, ON
Abstract :
Event driven phase noise simulation and modeling of an ADPLL by SystemVerilog is presented in this paper. It uses the simple Stochastic Voss-McCartney algorithm to generate the pink noise so that the 1/f phase noise effect can be easily modeled. Since the event driven simulation is extremely fast compared to the circuit level simulation, it allows circuit designers to explore different ADPLL architectures at the early stage without going through the time-consuming circuit level simulation. Pure SystemVerilog implementation also makes it possible to simulate the phase noise effect of the ADPLL efficiently in a large SOC system.
Keywords :
1/f noise; digital phase locked loops; system-on-chip; 1/f phase noise effect; ADPLL; SystemVerilog; large SOC system; phase locked loop; phase noise simulation; stochastic Voss-McCartney algorithm; 1f noise; Circuit noise; Circuit simulation; Discrete event simulation; Hardware design languages; Noise generators; Phase locked loops; Phase noise; System-on-a-chip; Working environment noise;
Conference_Titel :
Behavioral Modeling and Simulation Workshop, 2008. BMAS 2008. IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2896-0
DOI :
10.1109/BMAS.2008.4751235