• DocumentCode
    2367734
  • Title

    Micro thermal shear stress sensor with and without cavity underneath

  • Author

    Huang, Jin-Biao ; Ho, Chih-Ming ; Tung, Steve ; Liu, Chang ; Tai, Yu-Chong

  • fYear
    1995
  • fDate
    24-26 April 1995
  • Firstpage
    171
  • Abstract
    Micro hot-film shear-stress sensors have been designed and fabricated by surface micromachining technology compatible with IC technology. A poly-silicon strip, 2 μm×80 μm, is deposited on the top of a thin silicon nitride film and functions as the sensor element. By using sacrificial-layer technique, a cavity (vacuum chamber), 200×200×2 μm3, is placed between the silicon nitride film and silicon substrate. This cavity significantly decreases the heat loss to the substrate. For comparison purposes, a sensor structure without a cavity has also been designed and fabricated on the same chip. Theoretical analyses for the two vertical structures with and without a cavity show that the former has a lower frequency response and higher sensitivity than the latter. When the sensor is operated in constant temperature mode, the cut-off frequencies can reach 130 k-Hz and 9 k-Hz respectively for the sensors without and with cavities
  • Keywords
    Micromachining; Semiconductor films; Silicon; Strips; Substrates; Temperature sensors; Thermal sensors; Thermal stresses; Thin film sensors; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1995. IMTC/95. Proceedings. Integrating Intelligent Instrumentation and Control., IEEE
  • Conference_Location
    Waltham, MA, USA
  • Print_ISBN
    0-7803-2615-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1995.515123
  • Filename
    515123