DocumentCode :
2367734
Title :
Micro thermal shear stress sensor with and without cavity underneath
Author :
Huang, Jin-Biao ; Ho, Chih-Ming ; Tung, Steve ; Liu, Chang ; Tai, Yu-Chong
fYear :
1995
fDate :
24-26 April 1995
Firstpage :
171
Abstract :
Micro hot-film shear-stress sensors have been designed and fabricated by surface micromachining technology compatible with IC technology. A poly-silicon strip, 2 μm×80 μm, is deposited on the top of a thin silicon nitride film and functions as the sensor element. By using sacrificial-layer technique, a cavity (vacuum chamber), 200×200×2 μm3, is placed between the silicon nitride film and silicon substrate. This cavity significantly decreases the heat loss to the substrate. For comparison purposes, a sensor structure without a cavity has also been designed and fabricated on the same chip. Theoretical analyses for the two vertical structures with and without a cavity show that the former has a lower frequency response and higher sensitivity than the latter. When the sensor is operated in constant temperature mode, the cut-off frequencies can reach 130 k-Hz and 9 k-Hz respectively for the sensors without and with cavities
Keywords :
Micromachining; Semiconductor films; Silicon; Strips; Substrates; Temperature sensors; Thermal sensors; Thermal stresses; Thin film sensors; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1995. IMTC/95. Proceedings. Integrating Intelligent Instrumentation and Control., IEEE
Conference_Location :
Waltham, MA, USA
Print_ISBN :
0-7803-2615-6
Type :
conf
DOI :
10.1109/IMTC.1995.515123
Filename :
515123
Link To Document :
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