DocumentCode
2367777
Title
Analysis of software test item generation - comparison between high skilled and low skilled engineers
Author
Hirayama, Masayuki ; Yamamoto, Tetsuya ; Mizuno, Osamu ; Kikuno, Tohru
Author_Institution
Toshiba Corp., Japan
fYear
2003
fDate
16-19 Nov. 2003
Firstpage
210
Lastpage
215
Abstract
Recent software systems contain a lot of functions to provide various services. According to this tendency, it is difficult to ensure software quality and to eliminate crucial faults by conventional software testing methods. Especially, in the conventional method, the detail level of test items are widely varied, according to the engineers´ skill, and this causes an immature software quality. In this paper, we discuss the effects of test engineer skill on test item generation, and propose a new test item generation method, that enables the generation of test items for illegal behavior of the system. The proposed method can generate test items based on use-case analysis, deviation analysis for legal behavior, and fault tree analysis for system fault situations. From the result of the experimental applications, we confirmed that test items for illegal behavior of the system were effectively generated, and also the proposed method could effectively assist test item generation by poorly skilled engineers.
Keywords
fault diagnosis; program testing; software quality; deviation analysis; fault tree analysis; software quality; software test item generation; software testing; system illegal behavior test; test engineer skill level; test item detail level; use-case analysis; Automata; Character generation; Computer industry; Electrical products; Electronic mail; Embedded software; Fault diagnosis; Software quality; Software systems; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1951-2
Type
conf
DOI
10.1109/ATS.2003.1250811
Filename
1250811
Link To Document