Title :
Build-in-self-test for software
Author_Institution :
Shanghai Univ., China
Abstract :
Software testing has been a hard nut in the testing area for its complex and time-consuming nature. Taking advantage of mature technologies in hardware testing, we proposed a new approach to developing a new dimension of software testing called build-in-self-test (BIST) for software, which has long been applied in hardware testing as well as design for testability. This idea of testing methods from hardware is just to alleviate the burden of testing for software by transferring some testing work onto the programmer during programming so that the programmer and the tester can work together. Some new ideas are presented for further work.
Keywords :
built-in self test; design for testability; program testing; DFT; build-in-self-test; design for testability; programmer test generation; software BIST; software testing; Design for testability; Self-testing; Software testing;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250813